Presents an efficient method of fabric defect classification based on cluster analysis and support vector machine ( SVM). 提出一种基于聚类分析和支持向量机(SVM)的布匹瑕疵分类方法。
Fabric Defect Classification Based on Cluster Analysis and Support Vector Machine 基于聚类分析和支持向量机的布匹瑕疵分类方法
As a result a new generation of telecommand channel FPGA with more strong fault tolerant ability has been developed, which can implement fault tolerance itself and weaken the influence from defect cluster. 针对FPGA缺陷成团性,进行遥控指令通道FPGA布局优化,最终设计出能够自主容错,容错能力更强,可以应对缺陷成团性影响的新一代遥控指令通道FPGA。
Defect in Industry Cluster Development 我国产业集群发展中的缺陷
We analyzed the evolution behaviors of defect structures and void interfaces via molecular dynamics post-processing methods of bond-pair analysis, cluster identification, surface construction. 使用键对分析技术、团簇分析和界面构造技术等分子动力学后处理方法分析了缺陷结构和空洞界面的演化规律。